JEOL JSM 6100 with Secondary Electron Backscatter analysis capability

SEM allows observation of surface details of a prepared sample. This gives a useful magnification range of 25x to 80,000x

Backscatter imaging provides users limited information about elemental composition across the whole image.  This technique is useful for immunohistochemistry.

This is a robust instrument with a flexible specimen stage for observing a wide range of different size samples.  Images can be recorded on Polaroid film or on high glossy Thermal Print media.