JEOL JSM 6100 with Secondary Electron Backscatter analysis capability

SEM allows observation of surface details of a prepared sample. This gives a useful magnification range of 25x to 80,000x
Backscatter imaging provides users limited information about elemental composition across the whole image. This technique is useful for immunohistochemistry.
This is a robust instrument with a flexible specimen stage for observing a wide range of different size samples. Images can be recorded on Polaroid film or on high glossy Thermal Print media.
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