JEOL JSM 6100LV with Secondary Electron Backscatter                              Analysis Capability

SEM allows the observation of the surface details of a sample. This gives a magnification range of 5x to 300,000x . This microscope is equipped with four detectors that provide images of the surface topography of a sample and its elemental composition.

The design includes a low vacuum setting for samples that have excessive water content or a non-conductive surface and cannot be viewed at high vacuum. This microscope is equipped with a cold stage, which further extends its ability to look at hydrated (wet) samples. 

Energy Dispersive Spectroscopy (EDS) is also available. This detector provides information about the elemental composition of a sample and, when combined with a standard electron image, can tell us about the distribution of the elements with in the sample.

The purchase of this instrument was funded by a Major Instrumentation Grant from the National Science Foundation (NSF).